000 00369nam a2200133Ia 4500
008 190829s9999 xx 000 0 und d
020 _a0 8247 6665 2
082 _a519.287
_bBAI/S
100 _aBAIN, J. LEE
245 0 _aSTATISTICAL ANALYSIS OF THE RELIABILITY & TESTING MODELS
250 _a1st Ed.
260 _bMarcel Dekker, New York
_aNew York
_c1978
942 _cBK
999 _c1002
_d1002