BAIN, J. LEE <br/><br/>
STATISTICAL ANALYSIS OF THE RELIABILITY & TESTING MODELS 

 - 1st Ed. 
 - New York  Marcel Dekker, New York   1978 
<br/><br/><label>ISBN: </label>0 8247 6665 2 
<br/><br/><label>Dewey Class. No.: </label>519.287  / BAI/S